Test Access Data Module Set
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Features
- Independent Test Ports for Sending Loopback Codes
- Latching OCU, CSU, DSU, V.54, Smart Jack Loops
- Non-Intrusive (Monitor) Testing for Source or Destination
Introduction
The Test Access Module (TAM) of the DNX Multiservice Cross-Connect provides four test ports to send DDS Latching Loopback codes at only 56/64 Kbps. Each of these ports have network buss connections that function independently of each other.
Capabilities and Features
The Test Access Module (TAM) is a non-intrusive test device when monitoring the source or destination. It is an intrusive device when testing split source or split destination. It can also execute and/or monitor test patterns at 48 Kbps to 2.048 Mbps. The Interface Module provides the electrical interface for four high-speed ports that can be configured independently for RS-232, V.35, or RS-422 at the system console. Each port has a DB-25 female connector for termination to the attached device.
Benefits
The Test Access Module's DS0-level testing (DDS) within the DS1 is especially useful when trying to isolate a problem without affecting other users on the T1. Test patterns can be generated internally or by test equipment connected to the interface.